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Total-Ionizing-Dose Effects and Low-Frequency Noise in 16-nm InGaAs FinFETs With HfO<sub>2</sub>/Al<sub>2</sub>O<sub>3</sub> Dielectrics
Research article (IEEE Transactions on Nuclear Science, 2019) · cited 33× · AI/ML
Total-Ionizing-Dose Effects and Low-Frequency Noise in 16-nm InGaAs FinFETs With HfO2/Al2O3 Dielectrics
Summary
Total-Ionizing-Dose Effects and Low-Frequency Noise in 16-nm InGaAs FinFETs With HfO2/Al2O3 Dielectrics is a scholarly article[1].
Key Facts
Total-Ionizing-Dose Effects and Low-Frequency Noise in 16-nm InGaAs FinFETs With HfO2/Al2O3 Dielectrics's instance of is recorded as scholarly article[2].
References
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Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.
APA4ort.xyz Knowledge Graph. (2026). Total-Ionizing-Dose Effects and Low-Frequency Noise in 16-nm InGaAs FinFETs With HfO<sub>2</sub>/Al<sub>2</sub>O<sub>3</sub> Dielectrics. Retrieved May 24, 2026, from https://4ort.xyz/entity/total-ionizing-dose-effects-and-low-frequency-noise-in-16-nm-ingaas-finfets-with-hfo-sub-2-sub-al-sub-2-sub-o-sub-3-sub-
MLA“Total-Ionizing-Dose Effects and Low-Frequency Noise in 16-nm InGaAs FinFETs With HfO<sub>2</sub>/Al<sub>2</sub>O<sub>3</sub> Dielectrics.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/total-ionizing-dose-effects-and-low-frequency-noise-in-16-nm-ingaas-finfets-with-hfo-sub-2-sub-al-sub-2-sub-o-sub-3-sub-.
BibTeX@misc{4ortxyz_total-ionizing-dose-effects-and-low-frequency-noise-in-16-nm-ingaas-finfets-with-hfo-sub-2-sub-al-sub-2-sub-o-sub-3-sub-_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Total-Ionizing-Dose Effects and Low-Frequency Noise in 16-nm InGaAs FinFETs With HfO<sub>2</sub>/Al<sub>2</sub>O<sub>3</sub> Dielectrics}}, year = {2026}, url = {https://4ort.xyz/entity/total-ionizing-dose-effects-and-low-frequency-noise-in-16-nm-ingaas-finfets-with-hfo-sub-2-sub-al-sub-2-sub-o-sub-3-sub-}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Total-Ionizing-Dose Effects and Low-Frequency Noise in 16-nm InGaAs FinFETs With HfO<sub>2</sub>/Al<sub>2</sub>O<sub>3</sub> Dielectrics — https://4ort.xyz/entity/total-ionizing-dose-effects-and-low-frequency-noise-in-16-nm-ingaas-finfets-with-hfo-sub-2-sub-al-sub-2-sub-o-sub-3-sub- (retrieved 2026-05-24)
