Total internal reflection fluorescence based multiplane localization microscopy enables super-resolved volume imaging
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Total internal reflection fluorescence based multiplane localization microscopy enables super-resolved volume imaging is a scholarly article[1].
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Total internal reflection fluorescence based multiplane localization microscopy enables super-resolved volume imaging's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Total internal reflection fluorescence based multiplane localization microscopy enables super-resolved volume imaging. Retrieved May 24, 2026, from https://4ort.xyz/entity/total-internal-reflection-fluorescence-based-multiplane-localization-microscopy-enables-super-resolved-volume-imaging
