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ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment

Research article (Journal of the American Society for Mass Spectrometry, 2019) · cited 24× · AI/ML
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ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment

Summary

ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment is a scholarly article[1].

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  • ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment. Retrieved May 24, 2026, from https://4ort.xyz/entity/tof-sims-depth-profiling-of-organic-delta-layers-with-low-energy-cesium-ions-depth-resolution-assessment
MLA “ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/tof-sims-depth-profiling-of-organic-delta-layers-with-low-energy-cesium-ions-depth-resolution-assessment.
BibTeX @misc{4ortxyz_tof-sims-depth-profiling-of-organic-delta-layers-with-low-energy-cesium-ions-depth-resolution-assessment_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment}}, year = {2026}, url = {https://4ort.xyz/entity/tof-sims-depth-profiling-of-organic-delta-layers-with-low-energy-cesium-ions-depth-resolution-assessment}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): ToF-SIMS Depth Profiling of Organic Delta Layers with Low-Energy Cesium Ions: Depth Resolution Assessment — https://4ort.xyz/entity/tof-sims-depth-profiling-of-organic-delta-layers-with-low-energy-cesium-ions-depth-resolution-assessment (retrieved 2026-05-24)

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