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The Over-Reset Phenomenon in Ta<sub>2</sub>O<sub>5</sub> RRAM Device Investigated by the RTN-Based Defect Probing Technique
Research article (IEEE Electron Device Letters, 2018) · cited 20× · AI/ML
The Over-Reset Phenomenon in Ta2O5 RRAM Device Investigated by the RTN-Based Defect Probing Technique
Summary
The Over-Reset Phenomenon in Ta2O5 RRAM Device Investigated by the RTN-Based Defect Probing Technique is a scholarly article[1].
Key Facts
The Over-Reset Phenomenon in Ta2O5 RRAM Device Investigated by the RTN-Based Defect Probing Technique's instance of is recorded as scholarly article[2].
References
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APA4ort.xyz Knowledge Graph. (2026). The Over-Reset Phenomenon in Ta<sub>2</sub>O<sub>5</sub> RRAM Device Investigated by the RTN-Based Defect Probing Technique. Retrieved May 24, 2026, from https://4ort.xyz/entity/the-over-reset-phenomenon-in-ta-sub-2-sub-o-sub-5-sub-rram-device-investigated-by-the-rtn-based-defect-probing-technique
MLA“The Over-Reset Phenomenon in Ta<sub>2</sub>O<sub>5</sub> RRAM Device Investigated by the RTN-Based Defect Probing Technique.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/the-over-reset-phenomenon-in-ta-sub-2-sub-o-sub-5-sub-rram-device-investigated-by-the-rtn-based-defect-probing-technique.
BibTeX@misc{4ortxyz_the-over-reset-phenomenon-in-ta-sub-2-sub-o-sub-5-sub-rram-device-investigated-by-the-rtn-based-defect-probing-technique_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{The Over-Reset Phenomenon in Ta<sub>2</sub>O<sub>5</sub> RRAM Device Investigated by the RTN-Based Defect Probing Technique}}, year = {2026}, url = {https://4ort.xyz/entity/the-over-reset-phenomenon-in-ta-sub-2-sub-o-sub-5-sub-rram-device-investigated-by-the-rtn-based-defect-probing-technique}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): The Over-Reset Phenomenon in Ta<sub>2</sub>O<sub>5</sub> RRAM Device Investigated by the RTN-Based Defect Probing Technique — https://4ort.xyz/entity/the-over-reset-phenomenon-in-ta-sub-2-sub-o-sub-5-sub-rram-device-investigated-by-the-rtn-based-defect-probing-technique (retrieved 2026-05-24)
