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The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision
Research article (Ultramicroscopy, 2020) · cited 86× · AI/ML
The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision
Summary
The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision is a scholarly article[1].
Key Facts
The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision's instance of is recorded as scholarly article[2].
References
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APA4ort.xyz Knowledge Graph. (2026). The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision. Retrieved May 24, 2026, from https://4ort.xyz/entity/the-exit-wave-power-cepstrum-transform-for-scanning-nanobeam-electron-diffraction-robust-strain-mapping-at-subnanometer-
MLA“The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/the-exit-wave-power-cepstrum-transform-for-scanning-nanobeam-electron-diffraction-robust-strain-mapping-at-subnanometer-.
BibTeX@misc{4ortxyz_the-exit-wave-power-cepstrum-transform-for-scanning-nanobeam-electron-diffraction-robust-strain-mapping-at-subnanometer-_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision}}, year = {2026}, url = {https://4ort.xyz/entity/the-exit-wave-power-cepstrum-transform-for-scanning-nanobeam-electron-diffraction-robust-strain-mapping-at-subnanometer-}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision — https://4ort.xyz/entity/the-exit-wave-power-cepstrum-transform-for-scanning-nanobeam-electron-diffraction-robust-strain-mapping-at-subnanometer- (retrieved 2026-05-24)
