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TCAD-Enabled Machine Learning Defect Prediction to Accelerate Advanced Semiconductor Device Failure Analysis

Research article (2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2019) · cited 44× · AI/ML
academia openalex:W2980555067
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TCAD-Enabled Machine Learning Defect Prediction to Accelerate Advanced Semiconductor Device Failure Analysis

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TCAD-Enabled Machine Learning Defect Prediction to Accelerate Advanced Semiconductor Device Failure Analysis is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). TCAD-Enabled Machine Learning Defect Prediction to Accelerate Advanced Semiconductor Device Failure Analysis. Retrieved May 24, 2026, from https://4ort.xyz/entity/tcad-enabled-machine-learning-defect-prediction-to-accelerate-advanced-semiconductor-device-failure-analysis
MLA “TCAD-Enabled Machine Learning Defect Prediction to Accelerate Advanced Semiconductor Device Failure Analysis.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/tcad-enabled-machine-learning-defect-prediction-to-accelerate-advanced-semiconductor-device-failure-analysis.
BibTeX @misc{4ortxyz_tcad-enabled-machine-learning-defect-prediction-to-accelerate-advanced-semiconductor-device-failure-analysis_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{TCAD-Enabled Machine Learning Defect Prediction to Accelerate Advanced Semiconductor Device Failure Analysis}}, year = {2026}, url = {https://4ort.xyz/entity/tcad-enabled-machine-learning-defect-prediction-to-accelerate-advanced-semiconductor-device-failure-analysis}, note = {Accessed: 2026-05-24}}
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