Research on 3D TLC NAND flash reliability from the perspective of threshold voltage distribution

Research article (Microelectronics Reliability, 2020) · cited 10× · AI/ML
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Research on 3D TLC NAND flash reliability from the perspective of threshold voltage distribution

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Research on 3D TLC NAND flash reliability from the perspective of threshold voltage distribution is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Research on 3D TLC NAND flash reliability from the perspective of threshold voltage distribution. Retrieved May 24, 2026, from https://4ort.xyz/entity/research-on-3d-tlc-nand-flash-reliability-from-the-perspective-of-threshold-voltage-distribution
MLA “Research on 3D TLC NAND flash reliability from the perspective of threshold voltage distribution.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/research-on-3d-tlc-nand-flash-reliability-from-the-perspective-of-threshold-voltage-distribution.
BibTeX @misc{4ortxyz_research-on-3d-tlc-nand-flash-reliability-from-the-perspective-of-threshold-voltage-distribution_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Research on 3D TLC NAND flash reliability from the perspective of threshold voltage distribution}}, year = {2026}, url = {https://4ort.xyz/entity/research-on-3d-tlc-nand-flash-reliability-from-the-perspective-of-threshold-voltage-distribution}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Research on 3D TLC NAND flash reliability from the perspective of threshold voltage distribution — https://4ort.xyz/entity/research-on-3d-tlc-nand-flash-reliability-from-the-perspective-of-threshold-voltage-distribution (retrieved 2026-05-24)

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