Home ›
Entities
› academia
› Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle
Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle
Research article (IEEE Access, 2020) · cited 14× · AI/ML
Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle
Summary
Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle is a scholarly article[1].
Key Facts
Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle's instance of is recorded as scholarly article[2].
References
Programmatic citations — every numbered marker resolves to a verifiable graph row below.
Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.
APA4ort.xyz Knowledge Graph. (2026). Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle. Retrieved May 24, 2026, from https://4ort.xyz/entity/reliability-evaluation-of-multi-mechanism-failure-for-semiconductor-devices-using-physics-of-failure-technique-and-maxim
MLA“Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/reliability-evaluation-of-multi-mechanism-failure-for-semiconductor-devices-using-physics-of-failure-technique-and-maxim.
BibTeX@misc{4ortxyz_reliability-evaluation-of-multi-mechanism-failure-for-semiconductor-devices-using-physics-of-failure-technique-and-maxim_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle}}, year = {2026}, url = {https://4ort.xyz/entity/reliability-evaluation-of-multi-mechanism-failure-for-semiconductor-devices-using-physics-of-failure-technique-and-maxim}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Reliability Evaluation of Multi-Mechanism Failure for Semiconductor Devices Using Physics-of-Failure Technique and Maximum Entropy Principle — https://4ort.xyz/entity/reliability-evaluation-of-multi-mechanism-failure-for-semiconductor-devices-using-physics-of-failure-technique-and-maxim (retrieved 2026-05-24)
