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Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis

Research article (Microelectronics Reliability, 2021) · cited 14× · AI/ML
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Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis

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Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis is a scholarly article[1].

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  • Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis. Retrieved May 24, 2026, from https://4ort.xyz/entity/reliability-assessment-on-16-nm-ultrascale-mpsoc-using-fault-injection-and-fault-tree-analysis
MLA “Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/reliability-assessment-on-16-nm-ultrascale-mpsoc-using-fault-injection-and-fault-tree-analysis.
BibTeX @misc{4ortxyz_reliability-assessment-on-16-nm-ultrascale-mpsoc-using-fault-injection-and-fault-tree-analysis_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis}}, year = {2026}, url = {https://4ort.xyz/entity/reliability-assessment-on-16-nm-ultrascale-mpsoc-using-fault-injection-and-fault-tree-analysis}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Reliability assessment on 16 nm ultrascale+ MPSoC using fault injection and fault tree analysis — https://4ort.xyz/entity/reliability-assessment-on-16-nm-ultrascale-mpsoc-using-fault-injection-and-fault-tree-analysis (retrieved 2026-05-24)

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