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Recognition and Classification of Mixed Defect Pattern Wafer Map Based on Multi-Path DCNN

Research article (IEEE Transactions on Semiconductor Manufacturing, 2024) · cited 18× · AI/ML
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Recognition and Classification of Mixed Defect Pattern Wafer Map Based on Multi-Path DCNN

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Recognition and Classification of Mixed Defect Pattern Wafer Map Based on Multi-Path DCNN is a scholarly article[1].

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  • Recognition and Classification of Mixed Defect Pattern Wafer Map Based on Multi-Path DCNN's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). Recognition and Classification of Mixed Defect Pattern Wafer Map Based on Multi-Path DCNN. Retrieved May 24, 2026, from https://4ort.xyz/entity/recognition-and-classification-of-mixed-defect-pattern-wafer-map-based-on-multi-path-dcnn
MLA “Recognition and Classification of Mixed Defect Pattern Wafer Map Based on Multi-Path DCNN.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/recognition-and-classification-of-mixed-defect-pattern-wafer-map-based-on-multi-path-dcnn.
BibTeX @misc{4ortxyz_recognition-and-classification-of-mixed-defect-pattern-wafer-map-based-on-multi-path-dcnn_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Recognition and Classification of Mixed Defect Pattern Wafer Map Based on Multi-Path DCNN}}, year = {2026}, url = {https://4ort.xyz/entity/recognition-and-classification-of-mixed-defect-pattern-wafer-map-based-on-multi-path-dcnn}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Recognition and Classification of Mixed Defect Pattern Wafer Map Based on Multi-Path DCNN — https://4ort.xyz/entity/recognition-and-classification-of-mixed-defect-pattern-wafer-map-based-on-multi-path-dcnn (retrieved 2026-05-24)

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