Random Telegraph Noise Intensification After High-Temperature Phases in 3-D NAND Flash Arrays

Research article (IEEE Electron Device Letters, 2022) · cited 13× · AI/ML
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Random Telegraph Noise Intensification After High-Temperature Phases in 3-D NAND Flash Arrays

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Random Telegraph Noise Intensification After High-Temperature Phases in 3-D NAND Flash Arrays is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Random Telegraph Noise Intensification After High-Temperature Phases in 3-D NAND Flash Arrays. Retrieved May 24, 2026, from https://4ort.xyz/entity/random-telegraph-noise-intensification-after-high-temperature-phases-in-3-d-nand-flash-arrays
MLA “Random Telegraph Noise Intensification After High-Temperature Phases in 3-D NAND Flash Arrays.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/random-telegraph-noise-intensification-after-high-temperature-phases-in-3-d-nand-flash-arrays.
BibTeX @misc{4ortxyz_random-telegraph-noise-intensification-after-high-temperature-phases-in-3-d-nand-flash-arrays_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Random Telegraph Noise Intensification After High-Temperature Phases in 3-D NAND Flash Arrays}}, year = {2026}, url = {https://4ort.xyz/entity/random-telegraph-noise-intensification-after-high-temperature-phases-in-3-d-nand-flash-arrays}, note = {Accessed: 2026-05-24}}
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