Home ›
Entities
› academia
› Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2
Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2
Research article (Ultramicroscopy, 2016) · cited 27× · AI/ML
Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2
Summary
Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2 is a scholarly article[1].
Key Facts
Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2's instance of is recorded as scholarly article[2].
References
Programmatic citations — every numbered marker resolves to a verifiable graph row below.
Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.
APA4ort.xyz Knowledge Graph. (2026). Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2. Retrieved May 24, 2026, from https://4ort.xyz/entity/quantitative-measurement-of-mean-inner-potential-and-specimen-thickness-from-high-resolution-off-axis-electron-holograms
MLA“Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/quantitative-measurement-of-mean-inner-potential-and-specimen-thickness-from-high-resolution-off-axis-electron-holograms.
BibTeX@misc{4ortxyz_quantitative-measurement-of-mean-inner-potential-and-specimen-thickness-from-high-resolution-off-axis-electron-holograms_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2}}, year = {2026}, url = {https://4ort.xyz/entity/quantitative-measurement-of-mean-inner-potential-and-specimen-thickness-from-high-resolution-off-axis-electron-holograms}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Quantitative measurement of mean inner potential and specimen thickness from high-resolution off-axis electron holograms of ultra-thin layered WSe2 — https://4ort.xyz/entity/quantitative-measurement-of-mean-inner-potential-and-specimen-thickness-from-high-resolution-off-axis-electron-holograms (retrieved 2026-05-24)
