Physically Based Predictive Model for Single Event Transients in CMOS Gates

Research article (IEEE Transactions on Electron Devices, 2016) · cited 27× · AI/ML
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Physically Based Predictive Model for Single Event Transients in CMOS Gates

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Physically Based Predictive Model for Single Event Transients in CMOS Gates is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Physically Based Predictive Model for Single Event Transients in CMOS Gates. Retrieved May 24, 2026, from https://4ort.xyz/entity/physically-based-predictive-model-for-single-event-transients-in-cmos-gates
MLA “Physically Based Predictive Model for Single Event Transients in CMOS Gates.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/physically-based-predictive-model-for-single-event-transients-in-cmos-gates.
BibTeX @misc{4ortxyz_physically-based-predictive-model-for-single-event-transients-in-cmos-gates_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Physically Based Predictive Model for Single Event Transients in CMOS Gates}}, year = {2026}, url = {https://4ort.xyz/entity/physically-based-predictive-model-for-single-event-transients-in-cmos-gates}, note = {Accessed: 2026-05-24}}
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