Patent Quality: Towards a Systematic Framework for Analysis and Measurement
Research article (Research Policy, 2021) · cited 262× · AI/ML
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Direct Wikidata claims
- [2] ↑ Patent Quality: Towards a Systematic Framework for Analysis and Measurement — instance of (P31): scholarly article. wikidata.org.
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4ort.xyz Knowledge Graph. (2026). Patent Quality: Towards a Systematic Framework for Analysis and Measurement. Retrieved May 24, 2026, from https://4ort.xyz/entity/patent-quality-towards-a-systematic-framework-for-analysis-and-measurement
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“Patent Quality: Towards a Systematic Framework for Analysis and Measurement.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/patent-quality-towards-a-systematic-framework-for-analysis-and-measurement.
BibTeX
@misc{4ortxyz_patent-quality-towards-a-systematic-framework-for-analysis-and-measurement_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Patent Quality: Towards a Systematic Framework for Analysis and Measurement}}, year = {2026}, url = {https://4ort.xyz/entity/patent-quality-towards-a-systematic-framework-for-analysis-and-measurement}, note = {Accessed: 2026-05-24}}
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According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Patent Quality: Towards a Systematic Framework for Analysis and Measurement — https://4ort.xyz/entity/patent-quality-towards-a-systematic-framework-for-analysis-and-measurement (retrieved 2026-05-24)
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