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Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery
Research article (IEEE Transactions on Engineering Management, 2016) · cited 54× · AI/ML
Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery
Summary
Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery is a scholarly article[1].
Key Facts
Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery. Retrieved May 24, 2026, from https://4ort.xyz/entity/patent-clustering-and-outlier-ranking-methodologies-for-attributed-patent-citation-networks-for-technology-opportunity-d
MLA“Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/patent-clustering-and-outlier-ranking-methodologies-for-attributed-patent-citation-networks-for-technology-opportunity-d.
BibTeX@misc{4ortxyz_patent-clustering-and-outlier-ranking-methodologies-for-attributed-patent-citation-networks-for-technology-opportunity-d_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery}}, year = {2026}, url = {https://4ort.xyz/entity/patent-clustering-and-outlier-ranking-methodologies-for-attributed-patent-citation-networks-for-technology-opportunity-d}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Patent Clustering and Outlier Ranking Methodologies for Attributed Patent Citation Networks for Technology Opportunity Discovery — https://4ort.xyz/entity/patent-clustering-and-outlier-ranking-methodologies-for-attributed-patent-citation-networks-for-technology-opportunity-d (retrieved 2026-05-24)
