Overlay and edge placement control strategies for the 7nm node using EUV and ArF lithography

Research article (Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE, 2015) · cited 68× · AI/ML
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Overlay and edge placement control strategies for the 7nm node using EUV and ArF lithography

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Overlay and edge placement control strategies for the 7nm node using EUV and ArF lithography is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Overlay and edge placement control strategies for the 7nm node using EUV and ArF lithography. Retrieved May 24, 2026, from https://4ort.xyz/entity/overlay-and-edge-placement-control-strategies-for-the-7nm-node-using-euv-and-arf-lithography
MLA “Overlay and edge placement control strategies for the 7nm node using EUV and ArF lithography.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/overlay-and-edge-placement-control-strategies-for-the-7nm-node-using-euv-and-arf-lithography.
BibTeX @misc{4ortxyz_overlay-and-edge-placement-control-strategies-for-the-7nm-node-using-euv-and-arf-lithography_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Overlay and edge placement control strategies for the 7nm node using EUV and ArF lithography}}, year = {2026}, url = {https://4ort.xyz/entity/overlay-and-edge-placement-control-strategies-for-the-7nm-node-using-euv-and-arf-lithography}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Overlay and edge placement control strategies for the 7nm node using EUV and ArF lithography — https://4ort.xyz/entity/overlay-and-edge-placement-control-strategies-for-the-7nm-node-using-euv-and-arf-lithography (retrieved 2026-05-24)

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