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Overcoming Limited Fault Data: Intermittent Fault Detection in Analog Circuits via Improved GAN

Research article (IEEE Transactions on Instrumentation and Measurement, 2023) · cited 19× · AI/ML
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Overcoming Limited Fault Data: Intermittent Fault Detection in Analog Circuits via Improved GAN

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Overcoming Limited Fault Data: Intermittent Fault Detection in Analog Circuits via Improved GAN is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Overcoming Limited Fault Data: Intermittent Fault Detection in Analog Circuits via Improved GAN. Retrieved May 24, 2026, from https://4ort.xyz/entity/overcoming-limited-fault-data-intermittent-fault-detection-in-analog-circuits-via-improved-gan
MLA “Overcoming Limited Fault Data: Intermittent Fault Detection in Analog Circuits via Improved GAN.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/overcoming-limited-fault-data-intermittent-fault-detection-in-analog-circuits-via-improved-gan.
BibTeX @misc{4ortxyz_overcoming-limited-fault-data-intermittent-fault-detection-in-analog-circuits-via-improved-gan_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Overcoming Limited Fault Data: Intermittent Fault Detection in Analog Circuits via Improved GAN}}, year = {2026}, url = {https://4ort.xyz/entity/overcoming-limited-fault-data-intermittent-fault-detection-in-analog-circuits-via-improved-gan}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Overcoming Limited Fault Data: Intermittent Fault Detection in Analog Circuits via Improved GAN — https://4ort.xyz/entity/overcoming-limited-fault-data-intermittent-fault-detection-in-analog-circuits-via-improved-gan (retrieved 2026-05-24)

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