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Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage
Research article (IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2020) · cited 11× · AI/ML
Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage
Summary
Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage is a scholarly article[1].
Key Facts
Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage's instance of is recorded as scholarly article[2].
References
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Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.
APA4ort.xyz Knowledge Graph. (2026). Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage. Retrieved May 24, 2026, from https://4ort.xyz/entity/optimization-of-small-delay-defects-test-quality-by-clock-speed-selection-and-proper-masking-based-on-the-weighted-slack
MLA“Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/optimization-of-small-delay-defects-test-quality-by-clock-speed-selection-and-proper-masking-based-on-the-weighted-slack.
BibTeX@misc{4ortxyz_optimization-of-small-delay-defects-test-quality-by-clock-speed-selection-and-proper-masking-based-on-the-weighted-slack_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage}}, year = {2026}, url = {https://4ort.xyz/entity/optimization-of-small-delay-defects-test-quality-by-clock-speed-selection-and-proper-masking-based-on-the-weighted-slack}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Optimization of Small-Delay Defects Test Quality by Clock Speed Selection and Proper Masking Based on the Weighted Slack Percentage — https://4ort.xyz/entity/optimization-of-small-delay-defects-test-quality-by-clock-speed-selection-and-proper-masking-based-on-the-weighted-slack (retrieved 2026-05-24)
