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Optimal Feature Selection for Defect Classification in Semiconductor Wafers

Research article (IEEE Transactions on Semiconductor Manufacturing, 2022) · cited 40× · AI/ML
academia openalex:W4210430458
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Optimal Feature Selection for Defect Classification in Semiconductor Wafers

Summary

Optimal Feature Selection for Defect Classification in Semiconductor Wafers is a scholarly article[1].

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  • Optimal Feature Selection for Defect Classification in Semiconductor Wafers's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Optimal Feature Selection for Defect Classification in Semiconductor Wafers. Retrieved May 24, 2026, from https://4ort.xyz/entity/optimal-feature-selection-for-defect-classification-in-semiconductor-wafers
MLA “Optimal Feature Selection for Defect Classification in Semiconductor Wafers.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/optimal-feature-selection-for-defect-classification-in-semiconductor-wafers.
BibTeX @misc{4ortxyz_optimal-feature-selection-for-defect-classification-in-semiconductor-wafers_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Optimal Feature Selection for Defect Classification in Semiconductor Wafers}}, year = {2026}, url = {https://4ort.xyz/entity/optimal-feature-selection-for-defect-classification-in-semiconductor-wafers}, note = {Accessed: 2026-05-24}}
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