On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM

Research article (2021 IEEE 39th VLSI Test Symposium (VTS), 2021) · cited 24× · AI/ML
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On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM

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On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM. Retrieved May 24, 2026, from https://4ort.xyz/entity/on-the-reliability-of-in-memory-computing-impact-of-temperature-on-ferroelectric-tcam
MLA “On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/on-the-reliability-of-in-memory-computing-impact-of-temperature-on-ferroelectric-tcam.
BibTeX @misc{4ortxyz_on-the-reliability-of-in-memory-computing-impact-of-temperature-on-ferroelectric-tcam_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM}}, year = {2026}, url = {https://4ort.xyz/entity/on-the-reliability-of-in-memory-computing-impact-of-temperature-on-ferroelectric-tcam}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): On the Reliability of In-Memory Computing: Impact of Temperature on Ferroelectric TCAM — https://4ort.xyz/entity/on-the-reliability-of-in-memory-computing-impact-of-temperature-on-ferroelectric-tcam (retrieved 2026-05-24)

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