On Reduction of Deterministic Test Pattern Sets
Research article (2021 IEEE International Test Conference (ITC), 2021) · cited 20× · AI/ML
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4ort.xyz Knowledge Graph. (2026). On Reduction of Deterministic Test Pattern Sets. Retrieved May 24, 2026, from https://4ort.xyz/entity/on-reduction-of-deterministic-test-pattern-sets
“On Reduction of Deterministic Test Pattern Sets.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/on-reduction-of-deterministic-test-pattern-sets.
@misc{4ortxyz_on-reduction-of-deterministic-test-pattern-sets_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{On Reduction of Deterministic Test Pattern Sets}}, year = {2026}, url = {https://4ort.xyz/entity/on-reduction-of-deterministic-test-pattern-sets}, note = {Accessed: 2026-05-24}}
According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): On Reduction of Deterministic Test Pattern Sets — https://4ort.xyz/entity/on-reduction-of-deterministic-test-pattern-sets (retrieved 2026-05-24)
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