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On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults

Research article (2015 IEEE 24th Asian Test Symposium (ATS), 2015) · cited 10× · AI/ML
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On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults

Summary

On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults is a scholarly article[1].

Key Facts

  • On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults's instance of is recorded as scholarly article[2].

Related Entities

Janusz Rajski

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults. Retrieved May 24, 2026, from https://4ort.xyz/entity/on-improving-transition-test-set-quality-to-detect-cmos-transistor-stuck-open-faults
MLA “On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/on-improving-transition-test-set-quality-to-detect-cmos-transistor-stuck-open-faults.
BibTeX @misc{4ortxyz_on-improving-transition-test-set-quality-to-detect-cmos-transistor-stuck-open-faults_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults}}, year = {2026}, url = {https://4ort.xyz/entity/on-improving-transition-test-set-quality-to-detect-cmos-transistor-stuck-open-faults}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults — https://4ort.xyz/entity/on-improving-transition-test-set-quality-to-detect-cmos-transistor-stuck-open-faults (retrieved 2026-05-24)

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