Noise behavior of vertical tunnel FETs under the influence of interface trap states

Research article (Microelectronics Journal, 2021) · cited 26× · AI/ML
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Noise behavior of vertical tunnel FETs under the influence of interface trap states

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Noise behavior of vertical tunnel FETs under the influence of interface trap states is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Noise behavior of vertical tunnel FETs under the influence of interface trap states. Retrieved May 24, 2026, from https://4ort.xyz/entity/noise-behavior-of-vertical-tunnel-fets-under-the-influence-of-interface-trap-states
MLA “Noise behavior of vertical tunnel FETs under the influence of interface trap states.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/noise-behavior-of-vertical-tunnel-fets-under-the-influence-of-interface-trap-states.
BibTeX @misc{4ortxyz_noise-behavior-of-vertical-tunnel-fets-under-the-influence-of-interface-trap-states_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Noise behavior of vertical tunnel FETs under the influence of interface trap states}}, year = {2026}, url = {https://4ort.xyz/entity/noise-behavior-of-vertical-tunnel-fets-under-the-influence-of-interface-trap-states}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Noise behavior of vertical tunnel FETs under the influence of interface trap states — https://4ort.xyz/entity/noise-behavior-of-vertical-tunnel-fets-under-the-influence-of-interface-trap-states (retrieved 2026-05-24)

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