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APA4ort.xyz Knowledge Graph. (2026). NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits. Retrieved May 24, 2026, from https://4ort.xyz/entity/nbti-and-hcd-aware-behavioral-models-for-reliability-analysis-of-analog-cmos-circuits
MLA“NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/nbti-and-hcd-aware-behavioral-models-for-reliability-analysis-of-analog-cmos-circuits.
BibTeX@misc{4ortxyz_nbti-and-hcd-aware-behavioral-models-for-reliability-analysis-of-analog-cmos-circuits_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits}}, year = {2026}, url = {https://4ort.xyz/entity/nbti-and-hcd-aware-behavioral-models-for-reliability-analysis-of-analog-cmos-circuits}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits — https://4ort.xyz/entity/nbti-and-hcd-aware-behavioral-models-for-reliability-analysis-of-analog-cmos-circuits (retrieved 2026-05-24)
