Home › Entities › academia › Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects

Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects

Research article (IEEE Transactions on Circuits and Systems I Regular Papers, 2016) · cited 33× · AI/ML
academia openalex:W2556305966
Press Enter · cited answer in seconds

Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects

Summary

Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects is a scholarly article[1].

Key Facts

  • Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects's instance of is recorded as scholarly article[2].

References

Programmatic citations — every numbered marker resolves to a verifiable graph row below.

Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

📑 Cite this page

Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.

APA 4ort.xyz Knowledge Graph. (2026). Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects. Retrieved May 24, 2026, from https://4ort.xyz/entity/modeling-valance-change-memristor-device-oxide-thickness-material-type-and-temperature-effects
MLA “Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/modeling-valance-change-memristor-device-oxide-thickness-material-type-and-temperature-effects.
BibTeX @misc{4ortxyz_modeling-valance-change-memristor-device-oxide-thickness-material-type-and-temperature-effects_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects}}, year = {2026}, url = {https://4ort.xyz/entity/modeling-valance-change-memristor-device-oxide-thickness-material-type-and-temperature-effects}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Modeling Valance Change Memristor Device: Oxide Thickness, Material Type, and Temperature Effects — https://4ort.xyz/entity/modeling-valance-change-memristor-device-oxide-thickness-material-type-and-temperature-effects (retrieved 2026-05-24)

Canonical URL: https://4ort.xyz/entity/modeling-valance-change-memristor-device-oxide-thickness-material-type-and-temperature-effects · Last refreshed: