Modeling and Optimization of Bilayered TaO<sub>x</sub>RRAM Based on Defect Evolution and Phase Transition Effects

Research article (IEEE Transactions on Electron Devices, 2016) · cited 35× · AI/ML
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Modeling and Optimization of Bilayered TaOxRRAM Based on Defect Evolution and Phase Transition Effects

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Modeling and Optimization of Bilayered TaOxRRAM Based on Defect Evolution and Phase Transition Effects is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Modeling and Optimization of Bilayered TaO<sub>x</sub>RRAM Based on Defect Evolution and Phase Transition Effects. Retrieved May 24, 2026, from https://4ort.xyz/entity/modeling-and-optimization-of-bilayered-tao-sub-x-sub-rram-based-on-defect-evolution-and-phase-transition-effects
MLA “Modeling and Optimization of Bilayered TaO<sub>x</sub>RRAM Based on Defect Evolution and Phase Transition Effects.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/modeling-and-optimization-of-bilayered-tao-sub-x-sub-rram-based-on-defect-evolution-and-phase-transition-effects.
BibTeX @misc{4ortxyz_modeling-and-optimization-of-bilayered-tao-sub-x-sub-rram-based-on-defect-evolution-and-phase-transition-effects_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Modeling and Optimization of Bilayered TaO<sub>x</sub>RRAM Based on Defect Evolution and Phase Transition Effects}}, year = {2026}, url = {https://4ort.xyz/entity/modeling-and-optimization-of-bilayered-tao-sub-x-sub-rram-based-on-defect-evolution-and-phase-transition-effects}, note = {Accessed: 2026-05-24}}
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