Millimeter-Wave Avalanche Noise Sources Based on p-i-n Diodes in 130 nm SiGe BiCMOS Technology: Device Characterization and CAD Modeling

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Millimeter-Wave Avalanche Noise Sources Based on p-i-n Diodes in 130 nm SiGe BiCMOS Technology: Device Characterization and CAD Modeling

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Millimeter-Wave Avalanche Noise Sources Based on p-i-n Diodes in 130 nm SiGe BiCMOS Technology: Device Characterization and CAD Modeling is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Millimeter-Wave Avalanche Noise Sources Based on p-i-n Diodes in 130 nm SiGe BiCMOS Technology: Device Characterization and CAD Modeling. Retrieved May 24, 2026, from https://4ort.xyz/entity/millimeter-wave-avalanche-noise-sources-based-on-p-i-n-diodes-in-130-nm-sige-bicmos-technology-device-characterization-a
MLA “Millimeter-Wave Avalanche Noise Sources Based on p-i-n Diodes in 130 nm SiGe BiCMOS Technology: Device Characterization and CAD Modeling.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/millimeter-wave-avalanche-noise-sources-based-on-p-i-n-diodes-in-130-nm-sige-bicmos-technology-device-characterization-a.
BibTeX @misc{4ortxyz_millimeter-wave-avalanche-noise-sources-based-on-p-i-n-diodes-in-130-nm-sige-bicmos-technology-device-characterization-a_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Millimeter-Wave Avalanche Noise Sources Based on p-i-n Diodes in 130 nm SiGe BiCMOS Technology: Device Characterization and CAD Modeling}}, year = {2026}, url = {https://4ort.xyz/entity/millimeter-wave-avalanche-noise-sources-based-on-p-i-n-diodes-in-130-nm-sige-bicmos-technology-device-characterization-a}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Millimeter-Wave Avalanche Noise Sources Based on p-i-n Diodes in 130 nm SiGe BiCMOS Technology: Device Characterization and CAD Modeling — https://4ort.xyz/entity/millimeter-wave-avalanche-noise-sources-based-on-p-i-n-diodes-in-130-nm-sige-bicmos-technology-device-characterization-a (retrieved 2026-05-24)

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