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Microstructure analysis of epitaxial BaTiO3 thin films on SrTiO3-buffered Si: Strain and dislocation density quantification using HRXRD methods
Research article (Materialia, 2020) · cited 27× · AI/ML
Microstructure analysis of epitaxial BaTiO3 thin films on SrTiO3-buffered Si: Strain and dislocation density quantification using HRXRD methods
Summary
Microstructure analysis of epitaxial BaTiO3 thin films on SrTiO3-buffered Si: Strain and dislocation density quantification using HRXRD methods is a scholarly article[1].
Key Facts
Microstructure analysis of epitaxial BaTiO3 thin films on SrTiO3-buffered Si: Strain and dislocation density quantification using HRXRD methods's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Microstructure analysis of epitaxial BaTiO3 thin films on SrTiO3-buffered Si: Strain and dislocation density quantification using HRXRD methods. Retrieved May 24, 2026, from https://4ort.xyz/entity/microstructure-analysis-of-epitaxial-batio3-thin-films-on-srtio3-buffered-si-strain-and-dislocation-density-quantificati
MLA“Microstructure analysis of epitaxial BaTiO3 thin films on SrTiO3-buffered Si: Strain and dislocation density quantification using HRXRD methods.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/microstructure-analysis-of-epitaxial-batio3-thin-films-on-srtio3-buffered-si-strain-and-dislocation-density-quantificati.
BibTeX@misc{4ortxyz_microstructure-analysis-of-epitaxial-batio3-thin-films-on-srtio3-buffered-si-strain-and-dislocation-density-quantificati_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Microstructure analysis of epitaxial BaTiO3 thin films on SrTiO3-buffered Si: Strain and dislocation density quantification using HRXRD methods}}, year = {2026}, url = {https://4ort.xyz/entity/microstructure-analysis-of-epitaxial-batio3-thin-films-on-srtio3-buffered-si-strain-and-dislocation-density-quantificati}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Microstructure analysis of epitaxial BaTiO3 thin films on SrTiO3-buffered Si: Strain and dislocation density quantification using HRXRD methods — https://4ort.xyz/entity/microstructure-analysis-of-epitaxial-batio3-thin-films-on-srtio3-buffered-si-strain-and-dislocation-density-quantificati (retrieved 2026-05-24)
