Home › Entities › periodical › Microelectronics Reliability

Microelectronics Reliability

journal
Place periodical Q13852898
Press Enter · cited answer in seconds

Microelectronics Reliability

Summary

Microelectronics Reliability is a periodical[1].

Key Facts

  • Microelectronics Reliability's instance of is recorded as periodical[2].
  • Microelectronics Reliability's publisher is recorded as Elsevier[3].
  • Microelectronics Reliability's ISSN is recorded as 0026-2714[4].
  • Microelectronics Reliability's ISSN is recorded as 1872-941X[5].
  • Microelectronics Reliability's language of work or name is recorded as English[6].
  • Microelectronics Reliability's archives at is recorded as Portico[7].
  • Microelectronics Reliability's archives at is recorded as CLOCKSS[8].
  • Microelectronics Reliability's country of origin is recorded as United Kingdom[9].
  • Microelectronics Reliability's official website is recorded as http://www.sciencedirect.com/science/journal/00262714[10].
  • Microelectronics Reliability's NLM Unique ID is recorded as 101473207[11].
  • Microelectronics Reliability's ERA Journal ID is recorded as 4496[12].
  • Microelectronics Reliability's Scopus source ID is recorded as 26717[13].
  • Microelectronics Reliability's Danish Bibliometric Research Indicator level is recorded as 1[14].
  • Microelectronics Reliability's Danish Bibliometric Research Indicator is recorded as 7111[15].
  • Microelectronics Reliability's JUFO ID is recorded as 63338[16].
  • Microelectronics Reliability's title is recorded as Microelectronics and Reliability[17].
  • Microelectronics Reliability's Dialnet journal ID is recorded as 8399[18].
  • Microelectronics Reliability's OpenCitations bibliographic resource ID is recorded as 623268[19].
  • Microelectronics Reliability's Elsevier journal ID is recorded as microelectronics-reliability[20].
  • Microelectronics Reliability's ACNP journal ID is recorded as 53263[21].
  • Microelectronics Reliability's ACNP journal ID is recorded as 2107614[22].
  • Microelectronics Reliability's ISSN-L is recorded as 0026-2714[23].
  • Microelectronics Reliability's Scilit journal ID is recorded as 832501[24].
  • Microelectronics Reliability's Crossref journal ID is recorded as 1448[25].
  • Microelectronics Reliability's indexed in bibliographic review is recorded as Scopus[26].

Body

Designation and Status

Microelectronics Reliability's instance of is recorded as periodical[2].

References

Programmatic citations — every numbered marker resolves to a verifiable graph row below.

Direct Wikidata claims

  1. [2] ↑ . wikidata.org.
  2. [3] ↑ . wikidata.org.
  3. [4] ↑ . wikidata.org.
  4. [5] ↑ . ERA 2012 journal list. wikidata.org.
  5. [6] ↑ . ISSN Portal. wikidata.org.
  6. [7] ↑ . wikidata.org.
  7. [8] ↑ . wikidata.org.
  8. [9] ↑ . ISSN Portal. wikidata.org.
  9. [10] ↑ . ISSN Portal. wikidata.org.
  10. [11] ↑ . wikidata.org.
  11. [12] ↑ . ERA 2010 journal list. wikidata.org.
  12. [13] ↑ . Scopus. wikidata.org.
  13. [14] ↑ . BFI 2012 journal list. wikidata.org.
  14. [15] ↑ . BFI 2012 journal list. wikidata.org.
  15. [16] ↑ . wikidata.org.
  16. [17] ↑ . ISSN Portal. wikidata.org.
  17. [18] ↑ . wikidata.org.
  18. [19] ↑ . OpenCitations Corpus. wikidata.org.
  19. [20] ↑ . wikidata.org.
  20. [21] ↑ . National Collective Archive of Periodicals. Retrieved . wikidata.org.
  21. [22] ↑ . National Collective Archive of Periodicals. Retrieved . wikidata.org.
  22. [23] ↑ . wikidata.org.
  23. [24] ↑ . wikidata.org.
  24. [25] ↑ . wikidata.org.
  25. [26] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

📑 Cite this page

Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.

APA 4ort.xyz Knowledge Graph. (2026). Microelectronics Reliability. Retrieved May 3, 2026, from https://4ort.xyz/entity/microelectronics-reliability
MLA “Microelectronics Reliability.” 4ort.xyz Knowledge Graph, 4ort.xyz, 3 May. 2026, https://4ort.xyz/entity/microelectronics-reliability.
BibTeX @misc{4ortxyz_microelectronics-reliability_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Microelectronics Reliability}}, year = {2026}, url = {https://4ort.xyz/entity/microelectronics-reliability}, note = {Accessed: 2026-05-03}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Microelectronics Reliability — https://4ort.xyz/entity/microelectronics-reliability (retrieved 2026-05-03)

Canonical URL: https://4ort.xyz/entity/microelectronics-reliability · Last refreshed: