Home ›
Entities
› academia
› Measurement accuracy in X-ray computed tomography metrology: Toward a systematic analysis of interference effects in tomographic imaging
Measurement accuracy in X-ray computed tomography metrology: Toward a systematic analysis of interference effects in tomographic imaging
Research article (Precision Engineering, 2016) · cited 66× · AI/ML
Measurement accuracy in X-ray computed tomography metrology: Toward a systematic analysis of interference effects in tomographic imaging
Summary
Measurement accuracy in X-ray computed tomography metrology: Toward a systematic analysis of interference effects in tomographic imaging is a scholarly article[1].
Key Facts
Measurement accuracy in X-ray computed tomography metrology: Toward a systematic analysis of interference effects in tomographic imaging's instance of is recorded as scholarly article[2].
References
Programmatic citations — every numbered marker resolves to a verifiable graph row below.
Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.
APA4ort.xyz Knowledge Graph. (2026). Measurement accuracy in X-ray computed tomography metrology: Toward a systematic analysis of interference effects in tomographic imaging. Retrieved May 24, 2026, from https://4ort.xyz/entity/measurement-accuracy-in-x-ray-computed-tomography-metrology-toward-a-systematic-analysis-of-interference-effects-in-tomo
MLA“Measurement accuracy in X-ray computed tomography metrology: Toward a systematic analysis of interference effects in tomographic imaging.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/measurement-accuracy-in-x-ray-computed-tomography-metrology-toward-a-systematic-analysis-of-interference-effects-in-tomo.
BibTeX@misc{4ortxyz_measurement-accuracy-in-x-ray-computed-tomography-metrology-toward-a-systematic-analysis-of-interference-effects-in-tomo_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Measurement accuracy in X-ray computed tomography metrology: Toward a systematic analysis of interference effects in tomographic imaging}}, year = {2026}, url = {https://4ort.xyz/entity/measurement-accuracy-in-x-ray-computed-tomography-metrology-toward-a-systematic-analysis-of-interference-effects-in-tomo}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Measurement accuracy in X-ray computed tomography metrology: Toward a systematic analysis of interference effects in tomographic imaging — https://4ort.xyz/entity/measurement-accuracy-in-x-ray-computed-tomography-metrology-toward-a-systematic-analysis-of-interference-effects-in-tomo (retrieved 2026-05-24)
