Low Noise and High Photodetection Probability SPAD in 180 nm Standard CMOS Technology

Research article (2018 IEEE International Symposium on Circuits and Systems (ISCAS), 2018) · cited 14× · AI/ML

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Low Noise and High Photodetection Probability SPAD in 180 nm Standard CMOS Technology

Summary

Low Noise and High Photodetection Probability SPAD in 180 nm Standard CMOS Technology is a scholarly article^[1].

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Low Noise and High Photodetection Probability SPAD in 180 nm Standard CMOS Technology's instance of is recorded as scholarly article^[2].

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Direct Wikidata claims

[2] ↑ Low Noise and High Photodetection Probability SPAD in 180 nm Standard CMOS Technology — instance of (P31): scholarly article. wikidata.org.

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[1] ↑ Low Noise and High Photodetection Probability SPAD in 180 nm Standard CMOS Technology is an instance of scholarly article (scholarly article) [P31, primary]. Wikidata. wikidata.org.

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4ort.xyz Knowledge Graph. (2026). Low Noise and High Photodetection Probability SPAD in 180 nm Standard CMOS Technology. Retrieved May 24, 2026, from https://4ort.xyz/entity/low-noise-and-high-photodetection-probability-spad-in-180-nm-standard-cmos-technology

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“Low Noise and High Photodetection Probability SPAD in 180 nm Standard CMOS Technology.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/low-noise-and-high-photodetection-probability-spad-in-180-nm-standard-cmos-technology.

BibTeX

@misc{4ortxyz_low-noise-and-high-photodetection-probability-spad-in-180-nm-standard-cmos-technology_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Low Noise and High Photodetection Probability SPAD in 180 nm Standard CMOS Technology}}, year = {2026}, url = {https://4ort.xyz/entity/low-noise-and-high-photodetection-probability-spad-in-180-nm-standard-cmos-technology}, note = {Accessed: 2026-05-24}}

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