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Locally Adaptive Statistical Background Modeling With Deep Learning-Based False Positive Rejection for Defect Detection in Semiconductor Units
Research article (IEEE Transactions on Semiconductor Manufacturing, 2020) · cited 14× · AI/ML
Locally Adaptive Statistical Background Modeling With Deep Learning-Based False Positive Rejection for Defect Detection in Semiconductor Units
Summary
Locally Adaptive Statistical Background Modeling With Deep Learning-Based False Positive Rejection for Defect Detection in Semiconductor Units is a scholarly article[1].
Key Facts
Locally Adaptive Statistical Background Modeling With Deep Learning-Based False Positive Rejection for Defect Detection in Semiconductor Units's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Locally Adaptive Statistical Background Modeling With Deep Learning-Based False Positive Rejection for Defect Detection in Semiconductor Units. Retrieved May 24, 2026, from https://4ort.xyz/entity/locally-adaptive-statistical-background-modeling-with-deep-learning-based-false-positive-rejection-for-defect-detection-
MLA“Locally Adaptive Statistical Background Modeling With Deep Learning-Based False Positive Rejection for Defect Detection in Semiconductor Units.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/locally-adaptive-statistical-background-modeling-with-deep-learning-based-false-positive-rejection-for-defect-detection-.
BibTeX@misc{4ortxyz_locally-adaptive-statistical-background-modeling-with-deep-learning-based-false-positive-rejection-for-defect-detection-_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Locally Adaptive Statistical Background Modeling With Deep Learning-Based False Positive Rejection for Defect Detection in Semiconductor Units}}, year = {2026}, url = {https://4ort.xyz/entity/locally-adaptive-statistical-background-modeling-with-deep-learning-based-false-positive-rejection-for-defect-detection-}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Locally Adaptive Statistical Background Modeling With Deep Learning-Based False Positive Rejection for Defect Detection in Semiconductor Units — https://4ort.xyz/entity/locally-adaptive-statistical-background-modeling-with-deep-learning-based-false-positive-rejection-for-defect-detection- (retrieved 2026-05-24)
