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LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering

Research article (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2015) · cited 27× · AI/ML
academia openalex:W1980810142
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LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering

Summary

LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering is a scholarly article[1].

Key Facts

  • LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering. Retrieved May 24, 2026, from https://4ort.xyz/entity/lasic-layout-analysis-for-systematic-ic-defect-identification-using-clustering
MLA “LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/lasic-layout-analysis-for-systematic-ic-defect-identification-using-clustering.
BibTeX @misc{4ortxyz_lasic-layout-analysis-for-systematic-ic-defect-identification-using-clustering_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering}}, year = {2026}, url = {https://4ort.xyz/entity/lasic-layout-analysis-for-systematic-ic-defect-identification-using-clustering}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering — https://4ort.xyz/entity/lasic-layout-analysis-for-systematic-ic-defect-identification-using-clustering (retrieved 2026-05-24)

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