Large Scale Uniformity of Sputtering Deposited Single- and Few-Layer MoS<sub>2</sub>Investigated by XPS Multipoint Measurements and Histogram Analysis of Optical Contrast

Research article (ECS Journal of Solid State Science and Technology, 2016) · cited 14× · AI/ML
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Large Scale Uniformity of Sputtering Deposited Single- and Few-Layer MoS2Investigated by XPS Multipoint Measurements and Histogram Analysis of Optical Contrast

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Large Scale Uniformity of Sputtering Deposited Single- and Few-Layer MoS2Investigated by XPS Multipoint Measurements and Histogram Analysis of Optical Contrast is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Large Scale Uniformity of Sputtering Deposited Single- and Few-Layer MoS<sub>2</sub>Investigated by XPS Multipoint Measurements and Histogram Analysis of Optical Contrast. Retrieved May 24, 2026, from https://4ort.xyz/entity/large-scale-uniformity-of-sputtering-deposited-single-and-few-layer-mos-sub-2-sub-investigated-by-xps-multipoint-measure
MLA “Large Scale Uniformity of Sputtering Deposited Single- and Few-Layer MoS<sub>2</sub>Investigated by XPS Multipoint Measurements and Histogram Analysis of Optical Contrast.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/large-scale-uniformity-of-sputtering-deposited-single-and-few-layer-mos-sub-2-sub-investigated-by-xps-multipoint-measure.
BibTeX @misc{4ortxyz_large-scale-uniformity-of-sputtering-deposited-single-and-few-layer-mos-sub-2-sub-investigated-by-xps-multipoint-measure_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Large Scale Uniformity of Sputtering Deposited Single- and Few-Layer MoS<sub>2</sub>Investigated by XPS Multipoint Measurements and Histogram Analysis of Optical Contrast}}, year = {2026}, url = {https://4ort.xyz/entity/large-scale-uniformity-of-sputtering-deposited-single-and-few-layer-mos-sub-2-sub-investigated-by-xps-multipoint-measure}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Large Scale Uniformity of Sputtering Deposited Single- and Few-Layer MoS<sub>2</sub>Investigated by XPS Multipoint Measurements and Histogram Analysis of Optical Contrast — https://4ort.xyz/entity/large-scale-uniformity-of-sputtering-deposited-single-and-few-layer-mos-sub-2-sub-investigated-by-xps-multipoint-measure (retrieved 2026-05-24)

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