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Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques
Research article (IEEE Transactions on Semiconductor Manufacturing, 2019) · cited 28× · AI/ML
Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques
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Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques is a scholarly article[1].
Key Facts
Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques. Retrieved May 24, 2026, from https://4ort.xyz/entity/key-parameter-identification-and-defective-wafer-detection-of-semiconductor-manufacturing-processes-using-image-processi
MLA“Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/key-parameter-identification-and-defective-wafer-detection-of-semiconductor-manufacturing-processes-using-image-processi.
BibTeX@misc{4ortxyz_key-parameter-identification-and-defective-wafer-detection-of-semiconductor-manufacturing-processes-using-image-processi_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques}}, year = {2026}, url = {https://4ort.xyz/entity/key-parameter-identification-and-defective-wafer-detection-of-semiconductor-manufacturing-processes-using-image-processi}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Key Parameter Identification and Defective Wafer Detection of Semiconductor Manufacturing Processes Using Image Processing Techniques — https://4ort.xyz/entity/key-parameter-identification-and-defective-wafer-detection-of-semiconductor-manufacturing-processes-using-image-processi (retrieved 2026-05-24)
