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Investigation of Random Telegraph Noise Under Different Programmed Cell V<sub>t</sub> Levels in Charge Trap Based 3D NAND Flash
Research article (IEEE Electron Device Letters, 2022) · cited 19× · AI/ML
Investigation of Random Telegraph Noise Under Different Programmed Cell Vt Levels in Charge Trap Based 3D NAND Flash
Summary
Investigation of Random Telegraph Noise Under Different Programmed Cell Vt Levels in Charge Trap Based 3D NAND Flash is a scholarly article[1].
Key Facts
Investigation of Random Telegraph Noise Under Different Programmed Cell Vt Levels in Charge Trap Based 3D NAND Flash's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Investigation of Random Telegraph Noise Under Different Programmed Cell V<sub>t</sub> Levels in Charge Trap Based 3D NAND Flash. Retrieved May 24, 2026, from https://4ort.xyz/entity/investigation-of-random-telegraph-noise-under-different-programmed-cell-v-sub-t-sub-levels-in-charge-trap-based-3d-nand-
MLA“Investigation of Random Telegraph Noise Under Different Programmed Cell V<sub>t</sub> Levels in Charge Trap Based 3D NAND Flash.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/investigation-of-random-telegraph-noise-under-different-programmed-cell-v-sub-t-sub-levels-in-charge-trap-based-3d-nand-.
BibTeX@misc{4ortxyz_investigation-of-random-telegraph-noise-under-different-programmed-cell-v-sub-t-sub-levels-in-charge-trap-based-3d-nand-_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Investigation of Random Telegraph Noise Under Different Programmed Cell V<sub>t</sub> Levels in Charge Trap Based 3D NAND Flash}}, year = {2026}, url = {https://4ort.xyz/entity/investigation-of-random-telegraph-noise-under-different-programmed-cell-v-sub-t-sub-levels-in-charge-trap-based-3d-nand-}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Investigation of Random Telegraph Noise Under Different Programmed Cell V<sub>t</sub> Levels in Charge Trap Based 3D NAND Flash — https://4ort.xyz/entity/investigation-of-random-telegraph-noise-under-different-programmed-cell-v-sub-t-sub-levels-in-charge-trap-based-3d-nand- (retrieved 2026-05-24)