Improved Defect Detection of Guided Wave Testing Using Split-Spectrum Processing

Research article (Sensors, 2020) · cited 10× · AI/ML
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Improved Defect Detection of Guided Wave Testing Using Split-Spectrum Processing

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Improved Defect Detection of Guided Wave Testing Using Split-Spectrum Processing is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Improved Defect Detection of Guided Wave Testing Using Split-Spectrum Processing. Retrieved May 24, 2026, from https://4ort.xyz/entity/improved-defect-detection-of-guided-wave-testing-using-split-spectrum-processing
MLA “Improved Defect Detection of Guided Wave Testing Using Split-Spectrum Processing.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/improved-defect-detection-of-guided-wave-testing-using-split-spectrum-processing.
BibTeX @misc{4ortxyz_improved-defect-detection-of-guided-wave-testing-using-split-spectrum-processing_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Improved Defect Detection of Guided Wave Testing Using Split-Spectrum Processing}}, year = {2026}, url = {https://4ort.xyz/entity/improved-defect-detection-of-guided-wave-testing-using-split-spectrum-processing}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Improved Defect Detection of Guided Wave Testing Using Split-Spectrum Processing — https://4ort.xyz/entity/improved-defect-detection-of-guided-wave-testing-using-split-spectrum-processing (retrieved 2026-05-24)

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