Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs

Research article (IEEE Transactions on Nuclear Science, 2021) · cited 12× · AI/ML
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Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs

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Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs is a scholarly article[1].

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APA 4ort.xyz Knowledge Graph. (2026). Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs. Retrieved May 24, 2026, from https://4ort.xyz/entity/impacts-of-through-silicon-vias-on-total-ionizing-dose-effects-and-low-frequency-noise-in-finfets
MLA “Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/impacts-of-through-silicon-vias-on-total-ionizing-dose-effects-and-low-frequency-noise-in-finfets.
BibTeX @misc{4ortxyz_impacts-of-through-silicon-vias-on-total-ionizing-dose-effects-and-low-frequency-noise-in-finfets_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs}}, year = {2026}, url = {https://4ort.xyz/entity/impacts-of-through-silicon-vias-on-total-ionizing-dose-effects-and-low-frequency-noise-in-finfets}, note = {Accessed: 2026-05-24}}
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