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Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs
Research article (Microelectronics Journal, 2023) · cited 24× · AI/ML
Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs
Summary
Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs is a scholarly article[1].
Key Facts
Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs's instance of is recorded as scholarly article[2].
References
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Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.
APA4ort.xyz Knowledge Graph. (2026). Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs. Retrieved May 24, 2026, from https://4ort.xyz/entity/impact-of-temperature-variation-on-noise-parameters-and-hci-degradation-of-recessed-source-drain-junctionless-gate-all-a
MLA“Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/impact-of-temperature-variation-on-noise-parameters-and-hci-degradation-of-recessed-source-drain-junctionless-gate-all-a.
BibTeX@misc{4ortxyz_impact-of-temperature-variation-on-noise-parameters-and-hci-degradation-of-recessed-source-drain-junctionless-gate-all-a_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs}}, year = {2026}, url = {https://4ort.xyz/entity/impact-of-temperature-variation-on-noise-parameters-and-hci-degradation-of-recessed-source-drain-junctionless-gate-all-a}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Impact of temperature variation on noise parameters and HCI degradation of Recessed Source/Drain Junctionless Gate All Around MOSFETs — https://4ort.xyz/entity/impact-of-temperature-variation-on-noise-parameters-and-hci-degradation-of-recessed-source-drain-junctionless-gate-all-a (retrieved 2026-05-24)
