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Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy

Research article (Solid-State Electronics, 2015) · cited 13× · AI/ML
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Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy

Summary

Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy is a scholarly article[1].

Key Facts

  • Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy. Retrieved May 24, 2026, from https://4ort.xyz/entity/identification-of-si-film-traps-in-p-channel-soi-finfets-using-low-temperature-noise-spectroscopy
MLA “Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/identification-of-si-film-traps-in-p-channel-soi-finfets-using-low-temperature-noise-spectroscopy.
BibTeX @misc{4ortxyz_identification-of-si-film-traps-in-p-channel-soi-finfets-using-low-temperature-noise-spectroscopy_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy}}, year = {2026}, url = {https://4ort.xyz/entity/identification-of-si-film-traps-in-p-channel-soi-finfets-using-low-temperature-noise-spectroscopy}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Identification of Si film traps in p-channel SOI FinFETs using low temperature noise spectroscopy — https://4ort.xyz/entity/identification-of-si-film-traps-in-p-channel-soi-finfets-using-low-temperature-noise-spectroscopy (retrieved 2026-05-24)

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