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Hysteresis modeling with frequency-separation-based Gaussian process and its application to sinusoidal scanning for fast imaging of atomic force microscope
Research article (Sensors and Actuators A Physical, 2020) · cited 25× · AI/ML
Hysteresis modeling with frequency-separation-based Gaussian process and its application to sinusoidal scanning for fast imaging of atomic force microscope
Summary
Hysteresis modeling with frequency-separation-based Gaussian process and its application to sinusoidal scanning for fast imaging of atomic force microscope is a scholarly article[1].
Key Facts
Hysteresis modeling with frequency-separation-based Gaussian process and its application to sinusoidal scanning for fast imaging of atomic force microscope's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Hysteresis modeling with frequency-separation-based Gaussian process and its application to sinusoidal scanning for fast imaging of atomic force microscope. Retrieved May 24, 2026, from https://4ort.xyz/entity/hysteresis-modeling-with-frequency-separation-based-gaussian-process-and-its-application-to-sinusoidal-scanning-for-fast
MLA“Hysteresis modeling with frequency-separation-based Gaussian process and its application to sinusoidal scanning for fast imaging of atomic force microscope.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/hysteresis-modeling-with-frequency-separation-based-gaussian-process-and-its-application-to-sinusoidal-scanning-for-fast.
BibTeX@misc{4ortxyz_hysteresis-modeling-with-frequency-separation-based-gaussian-process-and-its-application-to-sinusoidal-scanning-for-fast_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Hysteresis modeling with frequency-separation-based Gaussian process and its application to sinusoidal scanning for fast imaging of atomic force microscope}}, year = {2026}, url = {https://4ort.xyz/entity/hysteresis-modeling-with-frequency-separation-based-gaussian-process-and-its-application-to-sinusoidal-scanning-for-fast}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Hysteresis modeling with frequency-separation-based Gaussian process and its application to sinusoidal scanning for fast imaging of atomic force microscope — https://4ort.xyz/entity/hysteresis-modeling-with-frequency-separation-based-gaussian-process-and-its-application-to-sinusoidal-scanning-for-fast (retrieved 2026-05-24)
