Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM)
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Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM) is a scholarly article[1].
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Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM)'s instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM). Retrieved May 24, 2026, from https://4ort.xyz/entity/histogram-method-for-reliable-thickness-measurements-of-graphene-films-using-atomic-force-microscopy-afm
MLA“Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM).” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/histogram-method-for-reliable-thickness-measurements-of-graphene-films-using-atomic-force-microscopy-afm.
BibTeX@misc{4ortxyz_histogram-method-for-reliable-thickness-measurements-of-graphene-films-using-atomic-force-microscopy-afm_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM)}}, year = {2026}, url = {https://4ort.xyz/entity/histogram-method-for-reliable-thickness-measurements-of-graphene-films-using-atomic-force-microscopy-afm}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM) — https://4ort.xyz/entity/histogram-method-for-reliable-thickness-measurements-of-graphene-films-using-atomic-force-microscopy-afm (retrieved 2026-05-24)
