Home › Entities › academia › GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes

GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes

Research article (IEEE Electron Device Letters, 2016) · cited 10× · AI/ML
academia openalex:W2481004426
Press Enter · cited answer in seconds

GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes

Summary

GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes is a scholarly article[1].

Key Facts

  • GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes's instance of is recorded as scholarly article[2].

References

Programmatic citations — every numbered marker resolves to a verifiable graph row below.

Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

📑 Cite this page

Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.

APA 4ort.xyz Knowledge Graph. (2026). GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes. Retrieved May 24, 2026, from https://4ort.xyz/entity/gr-noise-characterization-of-ge-pfinfets-with-sti-first-and-sti-last-processes
MLA “GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/gr-noise-characterization-of-ge-pfinfets-with-sti-first-and-sti-last-processes.
BibTeX @misc{4ortxyz_gr-noise-characterization-of-ge-pfinfets-with-sti-first-and-sti-last-processes_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes}}, year = {2026}, url = {https://4ort.xyz/entity/gr-noise-characterization-of-ge-pfinfets-with-sti-first-and-sti-last-processes}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes — https://4ort.xyz/entity/gr-noise-characterization-of-ge-pfinfets-with-sti-first-and-sti-last-processes (retrieved 2026-05-24)

Canonical URL: https://4ort.xyz/entity/gr-noise-characterization-of-ge-pfinfets-with-sti-first-and-sti-last-processes · Last refreshed: