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Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network
Research article (Expert Systems with Applications, 2022) · cited 81× · AI/ML
Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network
Summary
Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network is a scholarly article[1].
Key Facts
Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network's instance of is recorded as scholarly article[2].
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APA4ort.xyz Knowledge Graph. (2026). Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network. Retrieved May 24, 2026, from https://4ort.xyz/entity/geometric-transformation-based-data-augmentation-on-defect-classification-of-segmented-images-of-semiconductor-materials
MLA“Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/geometric-transformation-based-data-augmentation-on-defect-classification-of-segmented-images-of-semiconductor-materials.
BibTeX@misc{4ortxyz_geometric-transformation-based-data-augmentation-on-defect-classification-of-segmented-images-of-semiconductor-materials_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network}}, year = {2026}, url = {https://4ort.xyz/entity/geometric-transformation-based-data-augmentation-on-defect-classification-of-segmented-images-of-semiconductor-materials}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Geometric transformation-based data augmentation on defect classification of segmented images of semiconductor materials using a ResNet50 convolutional neural network — https://4ort.xyz/entity/geometric-transformation-based-data-augmentation-on-defect-classification-of-segmented-images-of-semiconductor-materials (retrieved 2026-05-24)
