Generic distortion model for metrology under optical microscopes

Research article (Optics and Lasers in Engineering, 2017) · cited 19× · AI/ML
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Generic distortion model for metrology under optical microscopes

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Generic distortion model for metrology under optical microscopes is a scholarly article[1].

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  • Generic distortion model for metrology under optical microscopes's instance of is recorded as scholarly article[2].

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APA 4ort.xyz Knowledge Graph. (2026). Generic distortion model for metrology under optical microscopes. Retrieved May 24, 2026, from https://4ort.xyz/entity/generic-distortion-model-for-metrology-under-optical-microscopes
MLA “Generic distortion model for metrology under optical microscopes.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/generic-distortion-model-for-metrology-under-optical-microscopes.
BibTeX @misc{4ortxyz_generic-distortion-model-for-metrology-under-optical-microscopes_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Generic distortion model for metrology under optical microscopes}}, year = {2026}, url = {https://4ort.xyz/entity/generic-distortion-model-for-metrology-under-optical-microscopes}, note = {Accessed: 2026-05-24}}
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