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Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run

Research article (IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2019) · cited 18× · AI/ML
academia openalex:W2969852599
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Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run

Summary

Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run is a scholarly article[1].

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  • Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run. Retrieved May 24, 2026, from https://4ort.xyz/entity/generating-single-and-double-pattern-tests-for-multiple-cmos-fault-models-in-one-atpg-run
MLA “Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/generating-single-and-double-pattern-tests-for-multiple-cmos-fault-models-in-one-atpg-run.
BibTeX @misc{4ortxyz_generating-single-and-double-pattern-tests-for-multiple-cmos-fault-models-in-one-atpg-run_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run}}, year = {2026}, url = {https://4ort.xyz/entity/generating-single-and-double-pattern-tests-for-multiple-cmos-fault-models-in-one-atpg-run}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run — https://4ort.xyz/entity/generating-single-and-double-pattern-tests-for-multiple-cmos-fault-models-in-one-atpg-run (retrieved 2026-05-24)

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