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Focal Auxiliary Classifier Generative Adversarial Network for Defective Wafer Pattern Recognition with Imbalanced Data

Research article (2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 2021) · cited 12× · AI/ML
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Focal Auxiliary Classifier Generative Adversarial Network for Defective Wafer Pattern Recognition with Imbalanced Data

Summary

Focal Auxiliary Classifier Generative Adversarial Network for Defective Wafer Pattern Recognition with Imbalanced Data is a scholarly article[1].

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  • Focal Auxiliary Classifier Generative Adversarial Network for Defective Wafer Pattern Recognition with Imbalanced Data's instance of is recorded as scholarly article[2].

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Focal Auxiliary Classifier Generative Adversarial Network for Defective Wafer Pattern Recognition with Imbalanced Data. Retrieved May 24, 2026, from https://4ort.xyz/entity/focal-auxiliary-classifier-generative-adversarial-network-for-defective-wafer-pattern-recognition-with-imbalanced-data
MLA “Focal Auxiliary Classifier Generative Adversarial Network for Defective Wafer Pattern Recognition with Imbalanced Data.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/focal-auxiliary-classifier-generative-adversarial-network-for-defective-wafer-pattern-recognition-with-imbalanced-data.
BibTeX @misc{4ortxyz_focal-auxiliary-classifier-generative-adversarial-network-for-defective-wafer-pattern-recognition-with-imbalanced-data_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Focal Auxiliary Classifier Generative Adversarial Network for Defective Wafer Pattern Recognition with Imbalanced Data}}, year = {2026}, url = {https://4ort.xyz/entity/focal-auxiliary-classifier-generative-adversarial-network-for-defective-wafer-pattern-recognition-with-imbalanced-data}, note = {Accessed: 2026-05-24}}
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