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Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filtering

Research article (Scientific Reports, 2021) · cited 22× · AI/ML
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Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filtering

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Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filtering is a scholarly article[1].

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  • Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filtering's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

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  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filtering. Retrieved May 24, 2026, from https://4ort.xyz/entity/five-second-stem-dislocation-tomography-for-300-nm-thick-specimen-assisted-by-deep-learning-based-noise-filtering
MLA “Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filtering.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/five-second-stem-dislocation-tomography-for-300-nm-thick-specimen-assisted-by-deep-learning-based-noise-filtering.
BibTeX @misc{4ortxyz_five-second-stem-dislocation-tomography-for-300-nm-thick-specimen-assisted-by-deep-learning-based-noise-filtering_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Five-second STEM dislocation tomography for 300 nm thick specimen assisted by deep-learning-based noise filtering}}, year = {2026}, url = {https://4ort.xyz/entity/five-second-stem-dislocation-tomography-for-300-nm-thick-specimen-assisted-by-deep-learning-based-noise-filtering}, note = {Accessed: 2026-05-24}}
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