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Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging
Research article (Advanced Structural and Chemical Imaging, 2018) · cited 41× · AI/ML
Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging
Summary
Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging is a scholarly article[1].
Key Facts
Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging's instance of is recorded as scholarly article[2].
References
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APA4ort.xyz Knowledge Graph. (2026). Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging. Retrieved May 24, 2026, from https://4ort.xyz/entity/feature-extraction-via-similarity-search-application-to-atom-finding-and-denoising-in-electron-and-scanning-probe-micros
MLA“Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/feature-extraction-via-similarity-search-application-to-atom-finding-and-denoising-in-electron-and-scanning-probe-micros.
BibTeX@misc{4ortxyz_feature-extraction-via-similarity-search-application-to-atom-finding-and-denoising-in-electron-and-scanning-probe-micros_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging}}, year = {2026}, url = {https://4ort.xyz/entity/feature-extraction-via-similarity-search-application-to-atom-finding-and-denoising-in-electron-and-scanning-probe-micros}, note = {Accessed: 2026-05-24}}
LLM promptAccording to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging — https://4ort.xyz/entity/feature-extraction-via-similarity-search-application-to-atom-finding-and-denoising-in-electron-and-scanning-probe-micros (retrieved 2026-05-24)
