Home › Entities › academia › Fault detection for semiconductor quality control based on Spark using data mining technology

Fault detection for semiconductor quality control based on Spark using data mining technology

Research article (2018 Chinese Control And Decision Conference (CCDC), 2018) · cited 11× · AI/ML
CreativeWork academia openalex:W2882845160
Press Enter · cited answer in seconds

Summary

Fault detection for semiconductor quality control based on Spark using data mining technology is a scholarly article[1].

Key Facts

  • Fault detection for semiconductor quality control based on Spark using data mining technology's instance of is recorded as scholarly article[2].

References

Programmatic citations — every numbered marker resolves to a verifiable graph row below.

Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

📑 Cite this page

Use these citations when quoting this entity in research, articles, AI prompts, or wherever provenance matters. We aggregate Wikidata + Wikipedia + authoritative open-data sources; the stitched, scored, cross-referenced view is what 4ort.xyz contributes.

APA 4ort.xyz Knowledge Graph. (2026). Fault detection for semiconductor quality control based on Spark using data mining technology. Retrieved May 24, 2026, from https://4ort.xyz/entity/fault-detection-for-semiconductor-quality-control-based-on-spark-using-data-mining-technology
MLA “Fault detection for semiconductor quality control based on Spark using data mining technology.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/fault-detection-for-semiconductor-quality-control-based-on-spark-using-data-mining-technology.
BibTeX @misc{4ortxyz_fault-detection-for-semiconductor-quality-control-based-on-spark-using-data-mining-technology_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Fault detection for semiconductor quality control based on Spark using data mining technology}}, year = {2026}, url = {https://4ort.xyz/entity/fault-detection-for-semiconductor-quality-control-based-on-spark-using-data-mining-technology}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Fault detection for semiconductor quality control based on Spark using data mining technology — https://4ort.xyz/entity/fault-detection-for-semiconductor-quality-control-based-on-spark-using-data-mining-technology (retrieved 2026-05-24)

Canonical URL: https://4ort.xyz/entity/fault-detection-for-semiconductor-quality-control-based-on-spark-using-data-mining-technology · Last refreshed: