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Fault detection for semiconductor quality control based on Spark using data mining technology

Research article (2018 Chinese Control And Decision Conference (CCDC), 2018) · cited 11× · AI/ML
academia openalex:W2882845160
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Fault detection for semiconductor quality control based on Spark using data mining technology

Summary

Fault detection for semiconductor quality control based on Spark using data mining technology is a scholarly article[1].

Key Facts

  • Fault detection for semiconductor quality control based on Spark using data mining technology's instance of is recorded as scholarly article[2].

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Direct Wikidata claims

  1. [2] ↑ . wikidata.org.

Class ancestry

  1. [1] ↑ . Wikidata. wikidata.org.

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APA 4ort.xyz Knowledge Graph. (2026). Fault detection for semiconductor quality control based on Spark using data mining technology. Retrieved May 24, 2026, from https://4ort.xyz/entity/fault-detection-for-semiconductor-quality-control-based-on-spark-using-data-mining-technology
MLA “Fault detection for semiconductor quality control based on Spark using data mining technology.” 4ort.xyz Knowledge Graph, 4ort.xyz, 24 May. 2026, https://4ort.xyz/entity/fault-detection-for-semiconductor-quality-control-based-on-spark-using-data-mining-technology.
BibTeX @misc{4ortxyz_fault-detection-for-semiconductor-quality-control-based-on-spark-using-data-mining-technology_2026, author = {{4ort.xyz Knowledge Graph}}, title = {{Fault detection for semiconductor quality control based on Spark using data mining technology}}, year = {2026}, url = {https://4ort.xyz/entity/fault-detection-for-semiconductor-quality-control-based-on-spark-using-data-mining-technology}, note = {Accessed: 2026-05-24}}
LLM prompt According to 4ort.xyz Knowledge Graph (aggregator of Wikidata, Wikipedia, and authoritative open-data sources): Fault detection for semiconductor quality control based on Spark using data mining technology — https://4ort.xyz/entity/fault-detection-for-semiconductor-quality-control-based-on-spark-using-data-mining-technology (retrieved 2026-05-24)

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